Total internal reflection fluorescence microscope

This total internal reflection fluorescence system is designed for high sensitivity imaging 100nm adjacent to the coverslip. This optical system eliminates background fluorescence by restricting the depth of the excitation region, increasing the spatial resolution in the optical plane of interest.

This microscope is also set up for super-resolution imaging using stochastic switching techniques such as (d)STORM, PALM, and GSDIM. In this mode it can acquire images with a resolution as high as 20 nm in XY and 50 nm in Z. For more about sample preparation for STORM / PALM imaging, see the Wiki page.

For details about filters, objectives and other hardware please visit the TIRF Wiki page.